期刊介绍
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
期刊语言要求
Language
Please write your text in good English (American or British usage is accepted, but not a mixture of these). Authors who feel their English language manuscript may require editing to eliminate possible grammatical or spelling errors and to conform to correct scientific English may wish to use the English Language Editing service.
投稿要求
CITESCORE
CiteScore SJR SNIP CiteScore排名
4.10 0.436 0.932 学科 分区 排名 百分位
大类：Engineering
小类：Safety, Risk, Reliability and Quality Q2 78 / 235 67%
大类：Engineering
小类：Electrical and Electronic Engineering Q2 355 / 970 63%
大类：Engineering
小类：Condensed Matter Physics Q2 185 / 443 58%
大类：Engineering
小类：Surfaces, Coatings and Films Q2 60 / 132 54%
大类：Engineering
小类：Atomic and Molecular Physics, and Optics Q2 108 / 232 53%
大类：Engineering
小类：Electronic, Optical and Magnetic Materials Q2 147 / 305 51%
WOS期刊JCR分区
WOS分区等级：
3区| 按JIF指标学科分区 | 收录子集 | JIF分区 | JIF排名 | JIF百分位 |
| 学科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | 226/366 |
|
| 学科：NANOSCIENCE & NANOTECHNOLOGY | SCIE | Q4 | 120/147 |
|
| 学科：PHYSICS, APPLIED | SCIE | Q3 | 134/187 |
|
| 按JCI指标学科分区 | 收录子集 | JCI分区 | JCI排名 | JCI百分位 |
| 学科：ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | 270/366 |
|
| 学科：NANOSCIENCE & NANOTECHNOLOGY | SCIE | Q4 | 115/147 |
|
| 学科：PHYSICS, APPLIED | SCIE | Q3 | 139/187 |
|
期刊分区表预警名单
2025年03月发布的2025版：不在预警名单中
2024年02月发布的2024版：不在预警名单中
2023年01月发布的2023版：不在预警名单中
2021年12月发布的2021版：不在预警名单中
2020年12月发布的2020版：不在预警名单中
中科院2025年3月升级版
点击查看中国科学院期刊分区趋势图| 大类学科 | 小类学科 | Top期刊 | 综述期刊 |
|---|
| 工程技术 3区3区2区 | PHYSICS, APPLIED
物理：应用 | 2区4区3区 | ENGINEERING, ELECTRICAL & ELECTRONIC
工程：电子与电气 | 2区1区4区 | NANOSCIENCE & NANOTECHNOLOGY
纳米科技 | 3区4区4区 |
| 否 | 否 |
中科院2023年12月旧的升级版
| 大类学科 | 小类学科 | Top期刊 | 综述期刊 |
|---|
| 工程技术 2区4区4区 | ENGINEERING, ELECTRICAL & ELECTRONIC
工程：电子与电气 | 3区3区4区 | NANOSCIENCE & NANOTECHNOLOGY
纳米科技 | 4区1区4区 | PHYSICS, APPLIED
物理：应用 | 4区4区4区 |
| 否 | 否 |
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