期刊介绍
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
投稿要求
CITESCORE
CiteScore SJR SNIP CiteScore排名
3.80 0.357 0.807 学科 分区 排名 百分位
大类:Engineering
小类:Electrical and Electronic Engineering Q2 387 / 970 60%
大类:Engineering
小类:Hardware and Architecture Q2 100 / 224 55%
大类:Engineering
小类:Software Q2 235 / 490 52%
WOS期刊JCR分区
WOS分区等级:
3区| 按JIF指标学科分区 | 收录子集 | JIF分区 | JIF排名 | JIF百分位 |
| 学科:COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | SCIE | Q3 | 42/60 |
|
| 学科:ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | 226/366 |
|
| 按JCI指标学科分区 | 收录子集 | JCI分区 | JCI排名 | JCI百分位 |
| 学科:COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | SCIE | Q3 | 45/60 |
|
| 学科:ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | Q3 | 240/366 |
|
期刊分区表预警名单
2025年03月发布的2025版:不在预警名单中
2024年02月发布的2024版:不在预警名单中
2023年01月发布的2023版:不在预警名单中
2021年12月发布的2021版:不在预警名单中
2020年12月发布的2020版:不在预警名单中
中科院2025年3月升级版
点击查看中国科学院期刊分区趋势图| 大类学科 | 小类学科 | Top期刊 | 综述期刊 |
|---|
| 计算机科学 3区4区2区 | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 计算机:硬件 | 3区4区4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气 | 3区3区4区 |
| 否 | 否 |
中科院2023年12月旧的升级版
| 大类学科 | 小类学科 | Top期刊 | 综述期刊 |
|---|
| 工程技术 4区4区4区 | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 计算机:硬件 | 2区1区4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气 | 3区4区4区 |
| 否 | 否 |